A NEW, OPTICAL-LEVER BASED ATOMIC-FORCE MICROSCOPE

被引：38
|
作者：
HANSMA, PK
DRAKE, B
GRIGG, D
PRATER, CB
YASHAR, F
GURLEY, G
ELING, SV
FEINSTEIN, S
LAL, R
机构：
[1] DIGITAL INSTRUMENTS,SANTA BARBARA,CA 93103
[2] UNIV CALIF SANTA BARBARA,NEUROSCI RES INST,SANTA BARBARA,CA 93106
[3] UNIV CALIF SANTA BARBARA,DEPT BIOL SCI,SANTA BARBARA,CA 93106
[4] UNIV CHICAGO,DEPT MED,CARDIOL SECT,CHICAGO,IL 60637
来源：
JOURNAL OF APPLIED PHYSICS | 1994年 / 76卷 / 02期
关键词：
D O I：
10.1063/1.357751
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A new optical-lever based atomic force microscope is described in which the cantilever scans and is accurately tracked by a scanning focused spot. It can operate at forces below one nanoNewton over image areas greater than 100 mu X 100 mu. It can be combined with optical microscopes of high numerical aperture and operated with the sample and cantilever in fluids. As examples of its applications, images of living cells in Petri dishes and a 6 in. (15.24 mm) silicon wafer are included.
引用
收藏
页码：796 / 799
页数：4
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