ION MIGRATION AND FREQUENCY-DEPENDENT DIELECTRIC LOSS

被引：4

作者：

TOSI, MP ^{[1
]}

MARCH, NH ^{[1
]}

机构：

[1] UNIV OXFORD,DEPT THEORET CHEM,OXFORD OX1 3TG,ENGLAND

来源：

PHYSICS AND CHEMISTRY OF LIQUIDS | 1978年 / 8卷 / 03期

关键词：

D O I：

10.1080/00319107808084748

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：143 / 151

页数：9

共 50 条

[21] FREQUENCY-DEPENDENT COMPLEX DIELECTRIC FUNCTION FOR SEMICONDUCTORS.
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[22] FREQUENCY-DEPENDENT AND WAVE-NUMBER-DEPENDENT DIELECTRIC FUNCTION OF SEMICONDUCTORS
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[23] Frequency-dependent dielectric response of ferroelectric–dielectric junction with negative electric capacitance
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[24] FREQUENCY-DEPENDENT DIELECTRIC FUNCTION OF A ZERO-GAP SEMICONDUCTOR
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[25] FREQUENCY-DEPENDENT FDTD MODELING OF OPTICALLY CONTROLLED DIELECTRIC RESONATORS
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[28] Temperature behavior of the frequency-dependent dielectric constant for a Stockmayer fluid
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[30] Frequency-dependent dielectric constant using generalized Langevin equation
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