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- [7] DETERMINATION BY X-RAY MICROPROBE OF THICKNESS AND COMPOSITION OF THIN SURFACE-LAYERS JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1985, 10 (04): : 279 - 290
- [8] X-RAY METHOD OF EXAMINING SURFACE-LAYERS OF IRON-ALLOYS INDUSTRIAL LABORATORY, 1977, 43 (03): : 355 - 356
- [9] CALIBRATION CURVE IN X-RAY SPECTRAL MICROANALYSIS OF FINITE-THICKNESS LAYERS INDUSTRIAL LABORATORY, 1984, 50 (04): : 351 - 353