CALIBRATION CURVE IN X-RAY SPECTRAL MICROANALYSIS OF FINITE-THICKNESS LAYERS

被引：0
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作者：
KACHALKINA, MN
MALYUKOV, BA
MARKOVA, TI
机构：
来源：
INDUSTRIAL LABORATORY | 1984年 / 50卷 / 04期
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暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
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页码：351 / 353
页数：3
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