DIFFRACTION-PATTERN SAMPLING AND ITS APPLICATIONS IN OPTICAL METROLOGY

被引：0
|
作者：
GORECKI, C
机构：
来源：
OPTICA APPLICATA | 1989年 / 19卷 / 04期
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中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
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页码：477 / 489
页数：13
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