CHARACTERISTICS OF THIN-FILM PROBE WITH TEMPERATURE COMPENSATION

被引：1
|
作者：
CHAN, WK
LIU, CY
WONG, YW
机构：
[1] School of Mechanical and Production Engineering, Nanyang Technological University, Singapore
来源：
FLOW MEASUREMENT AND INSTRUMENTATION | 1995年 / 6卷 / 02期
关键词：
THIN-FILM; MEASUREMENT; TEMPERATURE COMPENSATION;
D O I：
10.1016/0955-5986(95)94020-3
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
Analytical and experimental studies were carried out using an electrolytic technique to measure the thickness of a thin liquid film. It was found that the relationship between the thickness and the output voltage depends strongly on the area and the configuration of the probe. For a specific configuration and area of the probe, the output voltage depends on both the thickness and the temperature of the liquid. In order to achieve the output voltage as a unique function of the film thickness, the automatic temperature compensation method was applied. Comparisons were also made with analytical solutions. Good agreement was obtained.
引用
收藏
页码：137 / 140
页数：4
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