TEMPERATURE DEPENDENCE OF STRUCTURE OF THIN SILVER FILMS

被引:0
|
作者
JOHNSON, GW
机构
来源
PHYSICAL REVIEW | 1949年 / 76卷 / 04期
关键词
D O I
暂无
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:588 / 588
页数:1
相关论文
共 50 条
  • [1] THICKNESS DEPENDENCE OF STRUCTURE IN THIN-FILMS OF LOW-TEMPERATURE SILVER SELENIDE
    GUNTER, JR
    KEUSCH, P
    ULTRAMICROSCOPY, 1993, 49 (1-4) : 293 - 307
  • [2] DEPENDENCE OF PLASMA-RESONANCE-EMMISSION OF THIN SILVER FILMS ON TEMPERATURE
    KRETSCHMANN, E
    ZEITSCHRIFT FUR PHYSIK, 1969, 221 (04): : 357 - +
  • [3] Thickness and growth temperature dependence of structure and magnetism in FePt thin films
    Toney, MF
    Lee, WY
    Hedstrom, JA
    Kellock, A
    JOURNAL OF APPLIED PHYSICS, 2003, 93 (12) : 9902 - 9907
  • [4] VELOCITY DEPENDENCE OF IMPACT DEFORMATION OF THIN SILVER FILMS
    WINTER, RE
    FIELD, JE
    PHILOSOPHICAL MAGAZINE, 1974, 29 (02): : 395 - 406
  • [5] Thickness dependence on the thermal stability of silver thin films
    Kim, HC
    Alford, TL
    Allee, DR
    APPLIED PHYSICS LETTERS, 2002, 81 (22) : 4287 - 4289
  • [6] STRUCTURE OF THIN FILMS OF SILVER AND SILVER IODIDE ON SILVER BROMIDE SUBSTRATES
    BERRY, CR
    ACTA CRYSTALLOGRAPHICA, 1949, 2 (06): : 393 - &
  • [7] TEMPERATURE DEPENDENCE OF MOSSBAUER EFFECT IN THIN FILMS
    MOTOC, C
    CORCIOVE.A
    REVUE ROUMAINE DE PHYSIQUE, 1965, 10 (02): : 149 - +
  • [8] Temperature dependence of exchange biased thin films
    McGrath, BV
    Camley, RE
    Wee, L
    Kim, JV
    Stamps, RL
    JOURNAL OF APPLIED PHYSICS, 2000, 87 (09) : 6430 - 6432
  • [9] The temperature dependence of resistivity in thin metal films
    Marom, H.
    Eizenberg, M.
    Journal of Applied Physics, 2004, 96 (06): : 3319 - 3323
  • [10] The temperature dependence of resistivity in thin metal films
    Marom, H
    Eizenberg, M
    JOURNAL OF APPLIED PHYSICS, 2004, 96 (06) : 3319 - 3323