The temperature dependence of resistivity in thin metal films

被引：0
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作者：
Marom, H. [1 ]
Eizenberg, M. [1 ]
机构：
[1] Department of Materials Engineering, Technion, Israel Institute of Technology, 32000 Haifa, Israel
来源：
Journal of Applied Physics | 2004年 / 96卷 / 06期
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页码：3319 / 3323
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