The temperature dependence of resistivity in thin metal films

被引：0

作者：

Marom, H. ^{[1
]}

Eizenberg, M. ^{[1
]}

机构：

[1] Department of Materials Engineering, Technion, Israel Institute of Technology, 32000 Haifa, Israel

来源：

Journal of Applied Physics | 2004年 / 96卷 / 06期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：3319 / 3323

共 50 条

[41] Low-temperature epitaxial growth of thin metal films: In situ electrical resistivity study
Jalochowski, M
Hoffmann, M
Bauer, E
SURFACE DIFFUSION: ATOMISTIC AND COLLECTIVE PROCESSES, 1997, 360 : 253 - 261
[42] Anomalous temperature dependence of electrical resistivity in Pb0.8Sn0.2Te thin films
Das, VD
Bahulayan, C
THIN SOLID FILMS, 1996, 274 (1-2) : 55 - 62
[43] Temperature dependence of electric resistivity of Nd-Fe amorphous thin films and its thermal stability
Lu, Manqi
Wagendristel, A.
Wuli Xuebao/Acta Physica Sinica, 1993, 42 (05): : 840 - 846
[44] RESISTIVITY DEPENDENCE OF 1/F NOISE IN METAL-FILMS
FLEETWOOD, DM
GIORDANO, N
PHYSICAL REVIEW B, 1983, 27 (02): : 667 - 671
[45] Dependence of resistivity on surface profile in nanoscale metal films and wires
Feldman, Baruch
Deng, Rui
Dunham, Scott T.
JOURNAL OF APPLIED PHYSICS, 2008, 103 (11)
[46] THE RESISTIVITY AND TEMPERATURE-COEFFICIENT OF RESISTIVITY OF POLYCRYSTALLINE RHODIUM THIN-FILMS
KOSHY, J
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1980, 13 (07) : 1339 - 1342
[47] TEMPERATURE-DEPENDENCE OF THE ELECTRICAL-RESISTIVITY OF POTASSIUM FILMS
GRIDIN, VV
DATARS, WR
PHYSICAL REVIEW B, 1989, 40 (09): : 5967 - 5972
[48] Temperature dependence of the electrical resistivity of reactively sputtered TiN films
Tsai, W.
Delfino, M.
Fair, J.A.
Hodul, D.
Journal of Applied Physics, 1993, 73 (09):
[49] STRUCTURAL DEPENDENCE OF THE SPIN-DISORDER RESISTIVITY OF THIN DYSPROSIUM FILMS
DUDAS, J
FEHER, A
KAVECANSKY, V
PHYSICS LETTERS A, 1985, 109 (03) : 113 - 116
[50] TEMPERATURE DEPENDENCE OF MOSSBAUER EFFECT IN THIN FILMS
MOTOC, C
CORCIOVE.A
REVUE ROUMAINE DE PHYSIQUE, 1965, 10 (02): : 149 - +

← 1 2 3 4 5 →