X-RAY DIFFRACTION STUDY OF TIO UNDER HIGH PRESSURE

被引：0
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作者：
OGAWA, S
IWASAKI, H
KAMIGAKI, K
WATANABE, D
TERASAKI, O
机构：
来源：
ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY | 1969年 / A 25卷
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中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
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页码：S55 / &
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