INTERPRETATION OF EXCITON PHOTOLUMINESCENCE SPECTRA IN FILMS WITH SILICON QUANTUM DOTS

被引：0
|
作者：
Sachenko, A. V. [1 ]
Sokolovsky, I. O. [1 ]
Kaganovich, E. B. [1 ]
Manoilov, E. G. [1 ]
机构：
[1] Nat Acad Sci Ukraine, VE Lashkarev Inst Semicond Phys, 41,Nauky Prosp, UA-03028 Kiev, Ukraine
来源：
UKRAINIAN JOURNAL OF PHYSICS | 2006年 / 51卷 / 08期
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D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
The photoluminescence (PL) spectra in films with silicon quantum dots (Si QDs) - the Si nanocrystal (Si NC)/SiOx - matrix (x -> 2) system - have been considered in the framework of the excitonic photoluminescence model. The calculations made allowance for the discreteness of emitting Si NCs by size, which was determined by the minima in the oscillatory dependence of the exciton radiative lifetime on the Si NC dimensions, and the quantum- mechanical mesoscopic broadening of PL bands. A satisfactory agreement between measured and calculated PL spectra has been obtained.
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页码：800 / 804
页数：5
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