UNUSUAL ELASTIC-CONSTANTS OF CUBIC MNTE IN STRAINED-LAYER SUPERLATTICES MEASURED BY X-RAY-DIFFRACTION

被引：34

作者：

BUSCHERT, JR ^{[1
]}

PEIRIS, FC ^{[1
]}

SAMARTH, N ^{[1
]}

LUO, H ^{[1
]}

FURDYNA, JK ^{[1
]}

机构：

[1] UNIV NOTRE DAME,DEPT PHYS,NOTRE DAME,IN 46556

来源：

PHYSICAL REVIEW B | 1994年 / 49卷 / 07期

关键词：

D O I：

10.1103/PhysRevB.49.4619

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Elastic constants of the recently grown nonequilibrium zinc-blende form of MnTe were measured. Strained layer MnTe/ZnTe superlattices in which MnTe appears in this zinc-blende form were studied using triple crystal x-ray diffraction. The diffraction spectra were fitted using a dynamical model to determine the thickness and the lattice constants of each layer. From these and other measurements, the elastic constants C-11 and C-12 of MnTe were determined to be 2.22+/-0.1 and 1.16+/-0.1, respectively. These values are very low compared to all other zinc-blende or diamond structure materials investigated so far.

引用

页码：4619 / 4622

页数：4

共 50 条

[31] ANALYSIS OF GASB ALSB STRAINED LAYERS SUPERLATTICES USING SMALL-ANGLE X-RAY-DIFFRACTION
VILLAFLOR, AB
INOUE, Y
KIMATA, M
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1988, 27 (09): : 1580 - 1584
[32] DEBYE-WALLER FACTORS AND ELASTIC-CONSTANTS FOR BERYLLIUM-OXIDE AT TEMPERATURES BETWEEN 10-K AND 720-K .2. ELASTIC-CONSTANTS FROM X-RAY-DIFFRACTION DATA
SIROTA, NN
KUZMINA, AM
ORLOVA, NS
CRYSTAL RESEARCH AND TECHNOLOGY, 1992, 27 (05) : 711 - 716
[33] CHARACTERIZATION OF (IN,GA)AS/GAAS STRAINED-LAYER MULTIPLE QUANTUM-WELLS WITH HIGH-RESOLUTION X-RAY-DIFFRACTION AND COMPUTER-SIMULATIONS
ZAUS, R
SCHUSTER, M
GOBEL, H
REITHMAIER, JP
APPLIED SURFACE SCIENCE, 1991, 50 (1-4) : 92 - 96
[34] ELASTIC-MODULUS OF POLYETHYLENE IN THE CRYSTAL CHAIN DIRECTION AS MEASURED BY X-RAY-DIFFRACTION
MATSUO, M
SAWATARI, C
MACROMOLECULES, 1986, 19 (07) : 2036 - 2040
[35] X-RAY-DIFFRACTION AND DOPING STUDIES OF STRAINED-LAYER SUPER-LATTICES GROWN BY METAL ORGANIC-CHEMICAL VAPOR-DEPOSITION
BEIFELD, RM
OSBOURN, GC
GOURLEY, PL
FRITZ, IJ
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1983, 130 (03) : C96 - C96
[36] THE MEASUREMENT OF ELASTIC STRESSES AND ENERGY IN CUBIC SINGLE-CRYSTAL FILMS BY X-RAY-DIFFRACTION
RAO, SI
HOUSKA, CR
JOURNAL OF APPLIED PHYSICS, 1981, 52 (10) : 6322 - 6327
[37] Modelling intermixing of short period strained layer superlattices by means of X-ray diffraction analysis
Brennemann, A
Prost, W
Liu, Q
Auer, U
Tegude, FJ
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1997, 44 (1-3): : 87 - 90
[38] DETERMINATION OF INPLANE LATTICE-PARAMETERS OF INAS/ALAS STRAINED-LAYER SUPERLATTICES BY X-RAY PRECESSION CAMERA
MENDEZ, MP
FAYOS, J
BRIONES, F
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1989, 48 (05): : 471 - 473
[39] ELASTIC-MODULUS OF ISOTACTIC POLYPROPYLENE IN THE CRYSTAL CHAIN DIRECTION AS MEASURED BY X-RAY-DIFFRACTION
SAWATARI, C
MATSUO, M
MACROMOLECULES, 1986, 19 (10) : 2653 - 2656
[40] DETERMINATION OF THE STRAIN DISTRIBUTION IN SI/SI1-XGEX STRAINED LAYER SUPERLATTICES USING DOUBLE CRYSTAL X-RAY-DIFFRACTION - EXPERIMENT AND THEORY
BARNETT, SJ
BROWN, GT
HOUGHTON, DC
JOURNAL OF ELECTRONIC MATERIALS, 1988, 17 (04) : S18 - S18

← 1 2 3 4 5 →