SOME PROBLEMS OF MEASUREMENTS OF EPITAXIAL AND DIFFUSED LAYERS OF SEMICONDUCTORS

被引：0

作者：

FRANK, H ^{[1
]}

机构：

[1] CHECHOSLOVAK HIGHER TECH UNIV, FAK JADERNA FYS INZENYRSKA, PRAGUE, CZECHOSLOVAKIA

来源：

CESKOSLOVENSKY CASOPIS PRO FYSIKU SEKCE A | 1973年 / A 23卷 / 03期

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：253 / 271

页数：19

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