ANALYSIS OF THE PHOTO VOLTAGE DECAY (PVD) METHOD FOR MEASURING MINORITY-CARRIER LIFETIMES IN P-N-JUNCTION SOLAR-CELLS

被引：16

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作者：

VONROOS, O

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来源：

JOURNAL OF APPLIED PHYSICS | 1981年 / 52卷 / 09期

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D O I：

10.1063/1.329478

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O59 [应用物理学];

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页码：5833 / 5837

页数：5

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