RBS-PIXE ANALYSIS ON THIN-FILMS OF HIGH-TC OXIDE SUPERCONDUCTORS

被引：0
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作者：
ISHII, A
NAKAMURA, K
机构：
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1993年 / 75卷 / 1-4期
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中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
PIXE combined with RBS has been applied to analyze minor and major elements in thin films of oxide superconductors deposited onto MgO substrates. It is shown that minor elements such as Fe, Ni and Cr incorporated in the films can be clearly distinguished from those dissolved in the MgO substrates. The level of these minor elements differed depending on the sputtering geometry, and the effects of these impurities on the superconductivity are also discussed.
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页码：388 / 391
页数：4
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