TEM OBSERVATIONS OF SIC-SIC MATERIALS WITH A CARBON INTERPHASE AFTER TESTS AT HIGH-TEMPERATURE

被引：12
|
作者：
VICENS, J
ROUILLON, MH
FOURVEL, P
ABBE, F
GOMINA, M
CHERMANT, JL
机构：
来源：
MICROSCOPY MICROANALYSIS MICROSTRUCTURES | 1991年 / 2卷 / 01期
关键词：
D O I：
10.1051/mmm:019910020107500
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
A microstructural investigation has been performed by TEM on SiC-SiC materials annealed in air up to 1300-degrees-C and after creep experiments under vacuum in the temperature range 1000-1400-degrees-C. Microstructural modifications of these composites are discussed with respect to the macroscopic mechanical behaviour of SiC-SiC materials.
引用
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页码：75 / 85
页数：11
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