SPECIAL X-RAY APPARATUS FOR THE INVESTIGATION OF MATERIALS AT HIGH-TEMPERATURES

被引：0
|
作者：
PETKOV, VV
机构：
来源：
INDUSTRIAL LABORATORY | 1986年 / 52卷 / 12期
关键词：
CRYSTALS - X-Ray Analysis - DIFFRACTOMETERS - Reviews - RADIOGRAPHY - X-Ray - X-RAYS - Diffraction;
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The review provides a critical analysis of the achievements in the last 10-15 years in the field of instrument construction for x-ray diffractometric investigations of materials at high temperatures.
引用
收藏
页码：1089 / 1103
页数：15
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