EMITTER-COUPLED INTEGRATED-CIRCUITS AND THEIR APPLICATION IN NANOSECOND NUCLEAR ELECTRONICS (SURVEY)

被引：0

作者：

BASILADZE, SG ^{[1
]}

机构：

[1] DUBNA JOINT NUCL RES INST,DUBNA,USSR

来源：

INSTRUMENTS AND EXPERIMENTAL TECHNIQUES | 1976年 / 19卷 / 06期

关键词：

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1589 / 1604

页数：16

共 50 条

[41] A SCANNING LOCAL PROBE PROFILOMETER AND REFLECTOMETER - APPLICATION TO OPTICAL CONTROL OF INTEGRATED-CIRCUITS
SPAJER, M
BERGOSSI, O
GUIGNARD, M
[J]. OPTICS COMMUNICATIONS, 1994, 106 (4-6) : 139 - 145
[42] COMPUTER-AIDED-DESIGN METHODS FOR APPLICATION-SPECIFIC INTEGRATED-CIRCUITS
VINCENTELLI, AS
[J]. ALTA FREQUENZA, 1987, 56 (08): : 327 - 331
[43] MICROPROCESSOR BASED SYSTEMS AND APPLICATION SPECIFIC INTEGRATED-CIRCUITS - SOME PRIORITY AREAS
ACHARYA, GN
[J]. ELECTRONICS INFORMATION & PLANNING, 1987, 15 (03): : 175 - 192
[44] DEPOSITION OF TITANIUM NITRIDE/TUNGSTEN LAYERS FOR APPLICATION IN VERTICALLY INTEGRATED-CIRCUITS TECHNOLOGY
RUHL, G
FROSCHLE, B
RAMM, P
INTEMANN, A
PAMLER, W
[J]. APPLIED SURFACE SCIENCE, 1995, 91 (1-4) : 382 - 387
[45] APPLICATION OF AMORPHOUS-SILICON FIELD-EFFECT TRANSISTORS IN INTEGRATED-CIRCUITS
SNELL, AJ
SPEAR, WE
LECOMBER, PG
MACKENZIE, K
[J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1981, 26 (02): : 83 - 86
[46] APPLICATION OF LUMPED ELEMENT TECHNIQUES TO HIGH-FREQUENCY HYBRID INTEGRATED-CIRCUITS
CHADDOCK, RE
[J]. RADIO AND ELECTRONIC ENGINEER, 1974, 44 (08): : 414 - 420
[47] COMPACT GRATING STRUCTURE FOR APPLICATION TO FILTERS AND RESONATORS IN MONOLITHIC MICROWAVE INTEGRATED-CIRCUITS
WANG, TH
ITOH, T
[J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1987, 35 (12) : 1176 - 1182
[48] APPLICATION OF FLUOR-INERT LIQUID IN FAILURE ANALYSIS OF SEMICONDUCTOR INTEGRATED-CIRCUITS
NARAYANAN, M
SONI, V
[J]. SOLID STATE TECHNOLOGY, 1978, 21 (02) : 45 - 47
[49] OPTIMIZATION OF TISI2/N+-POLYSILICON PROCESS FOR APPLICATIONS TO POLYSILICON EMITTER BIPOLAR INTEGRATED-CIRCUITS
YU, YCS
DROBNY, VF
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1989, 136 (07) : 2076 - 2082
[50] THE USE OF BEST UNBIASED ESTIMATORS FOR STATISTICAL QUALITY-CONTROL OF INTEGRATED-CIRCUITS (SURVEY)
VOINOV, VG
NIKULIN, MS
[J]. INDUSTRIAL LABORATORY, 1988, 54 (07): : 793 - 800

← 1 2 3 4 5 →