A SIMPLE 2 PHASE LOCK-IN DETECTION SYSTEM FOR A MICROWAVE INTERFEROMETER

被引:0
|
作者
LEISTIKO, O
GULDBRANDSEN, T
机构
来源
关键词
D O I
10.1088/0022-3735/3/3/314
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:224 / +
页数:1
相关论文
共 50 条
  • [1] Phase lock-in reflectometry for detection and characterization of wiring system faults
    Ambalam, H
    Reibel, R
    Sathish, S
    Frock, B
    [J]. REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 25A AND 25B, 2006, 820 : 1554 - 1561
  • [2] COMPENSATIVE PHASE METER WITH LOCK-IN DETECTION
    SIUZDAK, J
    [J]. IEE PROCEEDINGS-G CIRCUITS DEVICES AND SYSTEMS, 1985, 132 (05): : 189 - 192
  • [3] The lock-in phase in the urotropinesebacic acid system
    [J]. Chapuis, G. (gervais.chapuis@ic.unil.ch), 1600, (Blackwell Munksgaard, Chester, CH1 2HU, United Kingdom):
  • [4] Lock-in detection with DataStudio
    Kraftmakher, Y
    [J]. AMERICAN JOURNAL OF PHYSICS, 2006, 74 (03) : 207 - 210
  • [5] Low-coherence lock-in interferometer for ophthalmology
    Oliveira, AC
    Yasuoka, FMM
    Santos, JB
    Carvalho, LAV
    Castro, JC
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (04): : 1877 - 1881
  • [6] Study on Detection of Weak Signal by Phase Lock-in Amplification
    Wu Zaiqun
    [J]. PROCEEDINGS OF 2017 9TH INTERNATIONAL CONFERENCE ON MEASURING TECHNOLOGY AND MECHATRONICS AUTOMATION (ICMTMA), 2017, : 109 - 112
  • [7] The lock-in phase in the urotropine-sebacic acid system
    Gardon, M
    Schönleber, A
    Chapuis, G
    Hostettler, M
    Bonin, M
    [J]. ACTA CRYSTALLOGRAPHICA SECTION C-CRYSTAL STRUCTURE COMMUNICATIONS, 2001, 57 (08) : 936 - 938
  • [8] AN IMPROVEMENT OF PHASE STABILIZATION OF A SIMPLE MICROWAVE INTERFEROMETER
    VANDERSI.B
    VANRUN, LPM
    [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (07): : 584 - &
  • [9] SIMPLE LOCK-IN AMPLIFIER USING A 4-QUADRANT ANALOG MULTIPLIER AND A PHASE LOCK LOOP
    RAMANI, K
    GANAPATHY, S
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1981, 52 (09): : 1364 - 1366
  • [10] Roughness measurements in the picometric range using a polarization interferometer and a multichannel lock-in detection technique
    Gleyzes, P
    Loriette, V
    Saint-Jalmes, H
    Boccara, AC
    [J]. INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE, 1998, 38 (5-6): : 715 - 717