Phase lock-in reflectometry for detection and characterization of wiring system faults

被引:0
|
作者
Ambalam, H [1 ]
Reibel, R
Sathish, S
Frock, B
机构
[1] Univ Dayton, Dept Elect & Comp Engn, Dayton, OH 45469 USA
[2] Univ Dayton Res Inst, Ctr Mat Diagnost, Dayton, OH 45469 USA
关键词
Phase Lock-in Reflectometry (PLR); wire fault location; Time Domain Reflectometry (TDR); Frequency Domain Reflectometry (FDR);
D O I
暂无
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
This paper describes the preliminary stage in the development of a Phase Lock-in Reflectometry (PLR) technique for detecting, locating and characterizing faults in electrical wiring systems. Results from the more-traditional techniques, e.g. Time-Domain Reflectometry (TDR) and Frequency-Domain Reflectometry (FDR) for detection and location of wiring-system faults are presented and compared with results from the PLR technique. The potential of PLR for characterizing wiring-system faults is briefly discussed. A methodology for combining wiring system models with experimental results to improve the characterization of faults as well as to improve the fundamental understanding of failure mechanisms is also presented.
引用
收藏
页码:1554 / 1561
页数:8
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