QUANTIFICATION OF ATOM-PROBE FIM DATA AND AN APPLICATION TO INVESTIGATION OF SURFACE SEGREGATION OF ALLOYS

被引：48
|
作者：
TSONG, TT
NG, YS
KRISHNASWAMY, SV
机构：
来源：
APPLIED PHYSICS LETTERS | 1978年 / 32卷 / 11期
关键词：
D O I：
10.1063/1.89892
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：778 / 780
页数：3
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