ATOMIC SCALE SURFACE-ANALYSIS WITH THE ATOM-PROBE FIM

被引：0

作者：

TSONG, TT ^{[1
]}

机构：

[1] ACAD SINICA,INST PHYS,TALPEI,TAIWAN

来源：

ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1991年 / 202卷

关键词：

D O I：

暂无

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：101 / PHYS

共 50 条

[1] ATOM-PROBE FIM ANALYSIS OF INTERACTION OF IMAGING GAS WITH SURFACE
MULLER, EW
KRISHNASWAMY, SV
MCLANE, SB
[J]. SURFACE SCIENCE, 1970, 23 (01) : 112 - +
[2] QUANTITATIVE SURFACE-ANALYSIS AT ATOMIC RESOLUTION, ATOM-PROBE FIELD-ION MICROSCOPY
TSONG, TT
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (04): : 3397 - 3404
[3] SURFACE ANALYSIS AT ATOMIC LEVEL USING ATOM-PROBE
MULLER, EW
[J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1976, : 2 - 2
[4] ATOMIC SCALE OBSERVATION OF HYDROGEN-INDUCED CRACK-GROWTH BY ATOM-PROBE FIM
KUK, Y
PICKERING, HW
SAKURAI, T
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (08) : C366 - C366
[5] FIM AND ATOM-PROBE STUDY OF POLYMERS
MARUYAMA, T
HASEGAWA, Y
NISHI, T
SAKURAI, T
[J]. JOURNAL DE PHYSIQUE, 1987, 48 (C-6): : 269 - 274
[6] QUANTIFICATION OF ATOM-PROBE FIM DATA
TSONG, TT
NG, YS
[J]. ULTRAMICROSCOPY, 1979, 4 (03) : 383 - 384
[7] MAGNETIC-SECTOR ATOM-PROBE FIM
MULLER, EW
SAKURAI, T
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (05): : 878 - 882
[8] TOF ATOM-PROBE FIM INVESTIGATION OF SURFACE SEGREGATION IN DILUTE ALLOYS
NG, YS
TSONG, TT
[J]. SURFACE SCIENCE, 1978, 78 (02) : 419 - 438
[9] SURFACE SEGREGATION OF A NICU ALLOY AS STUDIED BY A COMPUTERIZED ATOM-PROBE FIM
NG, YS
MCLANE, SB
TSONG, TT
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1980, 17 (01): : 154 - 158
[10] SURFACE-ANALYSIS AND GRAIN-BOUNDARY SEGREGATION MEASUREMENTS USING ATOM-PROBE TECHNIQUES
WAUGH, AR
SOUTHON, MJ
[J]. SURFACE SCIENCE, 1979, 89 (1-3) : 718 - 724

← 1 2 3 4 5 →