NEUTRALIZATION AND IONIZATION OF LOW-ENERGY HELIUM IONS SCATTERING FROM A COPPER SURFACE

被引:24
|
作者
VERHEIJ, LK [1 ]
POELSEMA, B [1 ]
BOERS, AL [1 ]
机构
[1] STATE UNIV GRONINGEN,TECH PHYS LAB,GRONINGEN,NETHERLANDS
来源
关键词
COPPER AND ALLOYS - IONS - Scattering;
D O I
10.1080/00337577708233144
中图分类号
TL [原子能技术]; O571 [原子核物理学];
学科分类号
0827 ; 082701 ;
摘要
Ion yield measurements are presented of 2-10 keV helium ions scattered from a copper (100) face. The scattering angle is 30 degree . The results are explained using a charge transfer model originally proposed by the authors. The model takes into account Auger neutralization as well as ionization and neutralization resulting from a violent collision. The present results are compared with previous experiments in which a primary atom beam was used. Within the experimental errors the results of both experiments can be explained using the same charge exchange parameters. A second result of the present investigation is that more convincing evidence is given for the occurrence of neutralization during the violent collision by a non-Auger process. It is probable that this process, as well as the ionization process, results from an interaction between the helium particle and the copper L shell electrons.
引用
收藏
页码:163 / 168
页数:6
相关论文
共 50 条
  • [41] INELASTIC EFFECTS IN THE SCATTERING OF LOW-ENERGY HELIUM-IONS FROM MONO-CRYSTALLINE SILICON
    BERTRAND, P
    NUCLEAR INSTRUMENTS & METHODS, 1980, 170 (1-3): : 489 - 493
  • [42] SCATTERING OF LOW-ENERGY NA+ IONS FROM A CLEAN POLYCRYSTALLINE AG SURFACE
    TERZIC, I
    CIRIC, D
    PEROVIC, B
    SURFACE SCIENCE, 1979, 85 (01) : 149 - 165
  • [43] NEUTRALIZATION EFFECTS IN LOW-ENERGY ION-SCATTERING
    WOODRUFF, DP
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 194 (1-3): : 639 - 647
  • [44] Low-energy electron-impact ionization of helium
    Bray, I
    Fursa, DV
    Roder, J
    Ehrhardt, H
    PHYSICAL REVIEW A, 1998, 57 (05): : R3161 - R3164
  • [45] Low-energy electron-impact ionization of helium
    Schow, E
    Hazlett, K
    Childers, JG
    Medina, C
    Vitug, G
    Bray, I
    Fursa, DV
    Khakoo, MA
    PHYSICAL REVIEW A, 2005, 72 (06):
  • [47] NEUTRALIZATION CONTRIBUTIONS IN LOW-ENERGY ION-SCATTERING
    MACDONALD, RJ
    OCONNOR, DJ
    HIGGINBOTTOM, P
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 2 (1-3): : 418 - 421
  • [48] Scattering of low-energy (10-350 eV) light ions from Al(111); Neutralization and dissociation
    Okada, M
    Murata, Y
    JOURNAL OF PHYSICS-CONDENSED MATTER, 1997, 9 (09) : 1919 - 1930
  • [49] Study of the amorphization of surface silicon layers implanted by low-energy helium ions
    A. A. Lomov
    A. V. Myakon’kikh
    A. P. Oreshko
    A. A. Shemukhin
    Crystallography Reports, 2016, 61 : 173 - 180
  • [50] Study of the amorphization of surface silicon layers implanted by low-energy helium ions
    Lomov, A. A.
    Myakon'kikh, A. V.
    Oreshko, A. P.
    Shemukhin, A. A.
    CRYSTALLOGRAPHY REPORTS, 2016, 61 (02) : 173 - 180