共 50 条
- [41] QUANTIFICATION OF MICROSTRUCTURAL EVOLUTION IN SPUTTERED A-SI THIN-FILMS BY REAL-TIME SPECTROSCOPIC ELLIPSOMETRY [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (03): : 632 - 637
- [43] Cubic CdS thin films studied by spectroscopic ellipsometry [J]. Journal of Materials Science: Materials in Electronics, 1997, 8 : 399 - 403
- [46] Spectroscopic ellipsometry of thin copper films on glass substrates [J]. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1993, 32 (5 S): : 2005 - 2009
- [47] Application of spectroscopic ellipsometry to characterization of optical thin films [J]. LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 2002 AND 7TH INTERNATIONAL WORKSHOP ON LASER BEAM AND OPTICS CHARACTERIZATION, 2003, 4932 : 393 - 404
- [48] Study of fabrication and spectroscopic ellipsometry of SBN thin films [J]. Gongneng Cailiao/Journal of Functional Materials, 2004, 35 (SUPPL.): : 178 - 180
- [50] DETERMINING THE POROSITY AND TRUE INDEX OF REFRACTION OF THIN-FILMS BY ELLIPSOMETRY [J]. SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1993, 60 (05): : 327 - 329