AC SUSCEPTIBILITY INVESTIGATION OF YBA2CU3O7 THIN-FILMS

被引：0

作者：

XING, W ^{[1
]}

HEINRICH, B ^{[1
]}

ZHOU, H ^{[1
]}

FIFE, AA ^{[1
]}

CRAGG, RA ^{[1
]}

机构：

[1] CTF SYST INC,PORT COQUITLAM,BC V3C 1M9,CANADA

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1995年 / 5卷 / 02期

关键词：

D O I：

10.1109/77.402831

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A Temperature dependence of ac susceptibilities, chi = X' - (i) chi'' were studied on YBa2Cu3O7 thin films as a function of sc frequency and driving field. The data were compared with theoretical calculations. Critical current densities were estimated by using the peak positions of chi'' The critical current densities were found in good agreement with those obtained by the screening and the scanning Hall-probe techniques. The thermally activated flux creep model describes well the observed frequency-dependent chi'' peak temperature.

引用

页码：1420 / 1423

页数：4

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