PHOTORESIST MATERIALS AND APPLICATIONS

被引:0
|
作者
LUSSOW, RO
机构
来源
关键词
D O I
暂无
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:169 / &
相关论文
共 50 条
  • [41] Design, synthesis, and photochemistry of diazocoumarins for photoresist applications.
    Tattersall, PI
    Leeson, M
    Yueh, W
    Breslin, D
    McAdams, CL
    McKean, DR
    Willson, CG
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2000, 219 : U240 - U240
  • [42] Trace contaminants from photoresist materials by modern spectrometry determination
    Ulieru, DG
    [J]. METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XII, 1998, 3332 : 721 - 726
  • [43] ICP etching of InP and related materials using photoresist as mask
    Deng, LG
    Goodyear, AL
    Dineen, MR
    [J]. APOC 2003: ASIA-PACIFIC OPTICAL AND WIRELESS COMMUNICATIONS; MATERIALS, ACTIVE DEVICES, AND OPTICAL AMPLIFIERS, PTS 1 AND 2, 2004, 5280 : 838 - 843
  • [44] Characterization of CD-SEM metrology for iArF photoresist materials
    Bunday, Benjamin
    Cordes, Aaron
    Orji, N. G.
    Piscani, Emil
    Cochran, Dan
    Byers, Jeff
    Allgair, John
    Rice, Bryan J.
    Avitan, Yohanan
    Peltinov, Ram
    Bar-Zvi, Maayan
    Adan, Ofer
    [J]. METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXII, PTS 1 AND 2, 2008, 6922 (1-2):
  • [45] MODELING AND SIMULATION OF MULTIPLE CHEMICAL-STATES IN PHOTORESIST MATERIALS
    FERGUSON, RA
    SPENCE, CA
    SHACHAMDIAMAND, Y
    NEUREUTHER, AR
    [J]. ADVANCES IN RESIST TECHNOLOGY AND PROCESSING VI, 1989, 1086 : 262 - 273
  • [46] Recent status of the stochastic issues of photoresist materials in EUV lithography
    Fujimori, Tom
    [J]. INTERNATIONAL CONFERENCE ON EXTREME ULTRAVIOLET LITHOGRAPHY 2022, 2022, 12292
  • [47] Directly written photo-crosslinked fluorinated polycarbonate photoresist materials for second-order nonlinear optical (NLO) applications
    Ding, Shuxiang
    Wang, Chunxue
    Shi, Xiaoyu
    Zou, Jiawei
    Cheng, Qiuli
    Zhu, Jiufu
    Shi, Zuosen
    Cai, Zhenzhen
    Chen, Changming
    Cui, Zhanchen
    [J]. JOURNAL OF MATERIALS CHEMISTRY C, 2019, 7 (16) : 4667 - 4672
  • [48] UV-SENSITIVE POLYARYLATES AS PHOTORESIST AND NONLINEAR OPTICS MATERIALS
    BRZOZOWSKI, ZK
    NONIEWICZ, K
    [J]. JOURNAL OF MACROMOLECULAR SCIENCE-PURE AND APPLIED CHEMISTRY, 1995, A32 : 959 - 968
  • [49] Investigating the threshold electron energy for reactions in EUV photoresist materials
    Kaminsky, Jake
    Grzeskowiak, Steven
    Gibbons, Sean
    Chandonait, Jonathan
    Welling, Ulrich
    Melvin, Lawrence S., III
    Kandel, Yudhishthir
    Brainard, Robert L.
    Denbeaux, Greg
    [J]. ADVANCES IN PATTERNING MATERIALS AND PROCESSES XXXV, 2018, 10586
  • [50] Recent Status of the Stochastic Issues of Photoresist Materials in EUV Lithography
    Fujimori, Toru
    [J]. JOURNAL OF PHOTOPOLYMER SCIENCE AND TECHNOLOGY, 2022, 35 (01) : 35 - 40