IMMUNE-RESPONSE IN EXPOSED MICE TO LOW-DOSE OF CO-60 GAMMA-RAY

被引:0
|
作者
IZUMO, Y
OGATA, H
机构
关键词
D O I
暂无
中图分类号
Q [生物科学];
学科分类号
07 ; 0710 ; 09 ;
摘要
引用
收藏
页码:555 / 563
页数:9
相关论文
共 50 条
  • [31] STUDIES ON PREPARATION AND USES OF CO-60 GAMMA-RAY IRRADIATED NATURAL LATEX
    KARTOWARDOYO, S
    SUNDARDI, F
    JOURNAL OF APPLIED POLYMER SCIENCE, 1977, 21 (11) : 3077 - 3085
  • [32] MICRONUCLEI INDUCED BY LOW-DOSE CO-60 GAMMA-IRRADIATION IN TRADESCANTIA POLLEN MOTHER CELLS
    ANDERSON, VA
    MA, TH
    ENVIRONMENTAL MUTAGENESIS, 1982, 4 (03): : 348 - 348
  • [33] Protection against alloxan diabetes by low-dose Co-60 gamma irradiation before alloxan administration
    Takehara, Y
    Yamaoka, K
    Hiraki, Y
    Yoshioka, T
    Utsumi, K
    PHYSIOLOGICAL CHEMISTRY AND PHYSICS AND MEDICAL NMR, 1995, 27 (03) : 149 - 159
  • [34] EFFECTS OF IRRADIATION CO-60 GAMMA-RAY ON MATURATION OF RAINBOW-TROUT
    TASHIRO, F
    BULLETIN OF THE JAPANESE SOCIETY OF SCIENTIFIC FISHERIES, 1972, 38 (08): : 793 - &
  • [35] EFFECT OF CO-60 GAMMA-RAYS ON POLYPHENYL METHACRYLATE OBTAINED BY GAMMA-RAY IRRADIATION
    RAGHUNATH, S
    RAO, MH
    RAO, KN
    RADIATION PHYSICS AND CHEMISTRY, 1983, 22 (06): : 1023 - 1027
  • [36] DOSE ASSIGNMENT CRITERIA FOR BEAGLES EXPOSED BILATERALLY TO CO-60 GAMMA-RAYS
    ANGLETON, GM
    HEALTH PHYSICS, 1978, 35 (05): : 625 - 628
  • [37] STIMULATING EFFECTS OF LOW-LEVELS OF CO-60 GAMMA-RAY ON THE SILKWORM, BOMBYX-MORI (L)
    ADBELSALAM, KA
    MAHMOUD, SM
    ANZEIGER FUR SCHADLINGSKUNDE PFLANZENSCHUTZ UMWELTSCHUTZ, 1995, 68 (07): : 147 - 150
  • [38] Loss-of-heterozygosity of chromosome 12 in malignant lymphomas from mice exposed to continuous low-dose rate gamma-ray irradiation
    Fujikawa, K.
    Takabatake, T.
    Tanaka, S.
    Ichinohe, T.
    Takada, M.
    Kakinuma, S.
    Nishimura, M.
    Shimada, Y.
    Tanaka, K.
    Oghiso, Y.
    EJC SUPPLEMENTS, 2005, 3 (02): : 59 - 59
  • [40] Effects of co-60 gamma-ray irradiation on the DC and RF characteristics of SiGe HBTs
    Yu, Guofang
    Cui, Jie
    Zhao, Yue
    Cui, Wenpu
    Fu, Jun
    MICROELECTRONICS RELIABILITY, 2024, 159