首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
American foundry equipment.
被引:0
|
作者
:
Lohse, U
论文数:
0
引用数:
0
h-index:
0
Lohse, U
机构
:
来源
:
ZEITSCHRIFT DES VEREINES DEUTSCHER INGENIEURE
|
1912年
/ 56卷
关键词
:
D O I
:
暂无
中图分类号
:
T [工业技术];
学科分类号
:
08 ;
摘要
:
引用
收藏
页码:1525 / 1531
页数:7
相关论文
共 50 条
[31]
AGRICULTURAL LIGHTNING EQUIPMENT.
Plyaskin, P.V.
论文数:
0
引用数:
0
h-index:
0
Plyaskin, P.V.
[J].
Soviet electrical engineering,
1980,
51
(09):
: 76
-
80
[32]
PU FOAM EQUIPMENT.
Miller, W.G.
论文数:
0
引用数:
0
h-index:
0
Miller, W.G.
[J].
Forest Products Journal,
1973,
46
(02):
: 50
-
53
[33]
HYDRAULIC DRILLING EQUIPMENT.
Nunn, J.W.
论文数:
0
引用数:
0
h-index:
0
Nunn, J.W.
Smith, J.F.
论文数:
0
引用数:
0
h-index:
0
Smith, J.F.
[J].
Mining Engineer (London),
1979,
138
(213):
: 903
-
910
[34]
ENVIRONMENTAL TEST EQUIPMENT.
Walton, J.Page
论文数:
0
引用数:
0
h-index:
0
Walton, J.Page
[J].
EP Electronic Production (London),
1985,
14
(07):
: 12
-
22
[35]
AVAILABLE DRYING EQUIPMENT.
Bradbury, D.S.
论文数:
0
引用数:
0
h-index:
0
机构:
Process Plant Pty Ltd, S Afr, Process Plant Pty Ltd, S Afr
Process Plant Pty Ltd, S Afr, Process Plant Pty Ltd, S Afr
Bradbury, D.S.
[J].
CHEMSA,
1987,
13
(05):
: 130
-
133
[36]
TERMINAL CONTROL EQUIPMENT.
Kawashima, Isao
论文数:
0
引用数:
0
h-index:
0
机构:
NTT, Electrical Appliance Lab,, Tokyo, Jpn, NTT, Electrical Appliance Lab, Tokyo, Jpn
NTT, Electrical Appliance Lab,, Tokyo, Jpn, NTT, Electrical Appliance Lab, Tokyo, Jpn
Kawashima, Isao
Amemiya, Fujio
论文数:
0
引用数:
0
h-index:
0
机构:
NTT, Electrical Appliance Lab,, Tokyo, Jpn, NTT, Electrical Appliance Lab, Tokyo, Jpn
NTT, Electrical Appliance Lab,, Tokyo, Jpn, NTT, Electrical Appliance Lab, Tokyo, Jpn
Amemiya, Fujio
Miyagishi, Osamu
论文数:
0
引用数:
0
h-index:
0
机构:
NTT, Electrical Appliance Lab,, Tokyo, Jpn, NTT, Electrical Appliance Lab, Tokyo, Jpn
NTT, Electrical Appliance Lab,, Tokyo, Jpn, NTT, Electrical Appliance Lab, Tokyo, Jpn
Miyagishi, Osamu
Nagai, Naofumi
论文数:
0
引用数:
0
h-index:
0
机构:
NTT, Electrical Appliance Lab,, Tokyo, Jpn, NTT, Electrical Appliance Lab, Tokyo, Jpn
NTT, Electrical Appliance Lab,, Tokyo, Jpn, NTT, Electrical Appliance Lab, Tokyo, Jpn
Nagai, Naofumi
[J].
Denki Tsushin Kenkyusho Kenkyu Jitsuyoka Hokoku,
1984,
33
(08):
: 1879
-
1891
[37]
ADVANCES IN MOLDING EQUIPMENT.
Iscoff, Ron
论文数:
0
引用数:
0
h-index:
0
机构:
Semiconductor Int, Des Plaines, IL,, USA, Semiconductor Int, Des Plaines, IL, USA
Semiconductor Int, Des Plaines, IL,, USA, Semiconductor Int, Des Plaines, IL, USA
Iscoff, Ron
[J].
1600,
(07):
[38]
AUTOMATIC INSPECTION EQUIPMENT.
Quinn, R.M.
论文数:
0
引用数:
0
h-index:
0
Quinn, R.M.
[J].
1600,
(18):
[39]
HARDNESS TESTING EQUIPMENT.
Petrick, H.
论文数:
0
引用数:
0
h-index:
0
Petrick, H.
[J].
Wire,
1988,
38
(02):
: 262
-
264
[40]
STANDARDIZED STARTING EQUIPMENT.
Peneder, F.
论文数:
0
引用数:
0
h-index:
0
Peneder, F.
Suchanek, V.
论文数:
0
引用数:
0
h-index:
0
Suchanek, V.
[J].
1978,
65
(09):
: 607
-
613
←
1
2
3
4
5
→