PROBABILISTIC STEADY-STATE AND DYNAMIC SECURITY ASSESSMENT

被引:55
|
作者
WU, FF [1 ]
TSAI, YK [1 ]
YU, YX [1 ]
机构
[1] UNIV CALIF BERKELEY, ELECTR RES LAB, BERKELEY, CA 94720 USA
关键词
D O I
10.1109/59.43173
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1 / 9
页数:9
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