CALCULATIONS OF THICKNESS DEPENDENCIES IN THE PROPERTIES OF ULTRA-THIN FILMS

被引:0
|
作者
BOETTGER, JC
机构
关键词
D O I
暂无
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The linear combinations of Gaussian type orbitals-fitting function (LCGTO-FF) technique has been used over the past eight years, to study a number of ultra-thin film (UTF) systems. Unlike most first principles work in this field, this ongoing investigation focussed on the ground-state properties of UTFs at their equilibrium geometries, as opposed to simply using the UTFs to model some macroscopic system. A summary of the statUS of LCGTO-FF UTF work is presented with emphasis on the variation of properties as a function of film thickness. One of the more important findings is that the interplanar separation and binding of Li has not converged for a 5-layer UTF. This result calls into question all surface relaxation calculations in which only the outer one or two layers are allowed to relax.
引用
收藏
页码:633 / 642
页数:10
相关论文
共 50 条
  • [1] Thickness dependencies in the calculated properties of metallic ultra-thin films
    Boettger, JC
    [J]. MICROSCOPIC SIMULATION OF INTERFACIAL PHENOMENA IN SOLIDS AND LIQUIDS, 1998, 492 : 157 - 167
  • [2] Dielectric properties of ultra-thin films
    Nakamura, J
    Ishihara, S
    Ozawa, H
    Natori, A
    [J]. PHYSICS OF SEMICONDUCTORS, PTS A AND B, 2005, 772 : 951 - 952
  • [3] Thickness and substrate effects on the perpendicular magnetic properties of ultra-thin TbFeCo films
    Wang, Ke
    Dong, Shuo
    Xu, Zhan
    [J]. SURFACE & COATINGS TECHNOLOGY, 2019, 359 : 296 - 299
  • [4] Thickness measurements of ultra-thin films using AFM
    Kim, TH
    Kwon, HI
    Lee, JD
    Park, BG
    [J]. MICROPROCESSES AND NANOTECHNOLOGY 2001, DIGEST OF PAPERS, 2001, : 240 - 241
  • [5] MAGNETIC-PROPERTIES OF ULTRA-THIN FILMS
    GRADMANN, U
    ELMERS, HJ
    PRZYBYLSKI, M
    [J]. JOURNAL DE PHYSIQUE, 1988, 49 (C-8): : 1665 - 1669
  • [6] Properties of ultra-thin conjugated monolayer films
    Zhang, Xiaoyu
    Unarunotai, Sakulsuk
    Schultz, Mitchell J.
    Moore, Jeffrey S.
    Rogers, John A.
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2007, 234
  • [7] ELECTROCHEMICAL PROPERTIES OF ULTRA-THIN SILICA FILMS
    XU, XP
    BOJKOV, H
    GOODMAN, DW
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1993, 206 : 15 - PHYS
  • [8] Optical properties of ultra-thin metal films
    Gompf, B.
    Brandt, T.
    Beister, J.
    Dressel, M.
    Drichko, N.
    [J]. CONFERENCE DIGEST OF THE 2006 JOINT 31ST INTERNATIONAL CONFERENCE ON INFRARED AND MILLIMETER WAVES AND 14TH INTERNATIONAL CONFERENCE ON TERAHERTZ ELECTRONICS, 2006, : 468 - 468
  • [9] A Monte Carlo study of the thickness determination of ultra-thin films
    Tan, ZY
    Xia, YY
    [J]. SCANNING, 2002, 24 (05) : 257 - 263
  • [10] Thickness determination of ultra-thin films on Si substrates by EPMA
    Campos, CS
    Vasconcellos, MAZ
    Llovet, X
    Salvat, F
    [J]. MICROCHIMICA ACTA, 2004, 145 (1-4) : 13 - 17