COMPARATIVE CALIBRATION OF GLASS MICROPIPETS BY LIGHT AND SCANNING ELECTRON-MICROSCOPY

被引：0
|
作者：
UNGER, J [1 ]
SCHEVEN, C [1 ]
VOLKSCH, G [1 ]
机构：
[1] UNIV JENA,BEREICH WISSENSCH GLASCHEM,SEKT CHEM,DDR-69 JENA,GER DEM REP
来源：
MICROSCOPICA ACTA | 1980年 / 83卷 / 02期
关键词：
D O I：
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中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：131 / 136
页数：6
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