共 33 条
- [21] A new characterization technique of "four hot S parameters" for the study of nonlinear parametric behaviors of microwave devices. 2003 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3, 2003, : 1663 - 1666
- [23] A NEW SALMONELLA TESTER STRAIN, TA97, FOR THE DETECTION OF FRAMESHIFT MUTAGENS - A RUN OF CYTOSINES AS A MUTATIONAL HOT-SPOT MUTATION RESEARCH, 1982, 94 (02): : 315 - 330
- [24] A new extraction technique for the series resistances of semiconductor devices based on the intrinsic properties of bias-dependent Y-parameters PROCEEDING OF THE 2004 BIPOLAR/BICMOS CIRCUITS AND TECHNOLOGY MEETING, 2004, : 148 - 151
- [25] Ultrasonic Defect Detection in Multi-Material, Axis-Symmetric Devices with an Improved Synthetic Aperture Focusing Technique (SAFT) 2012 IEEE INTERNATIONAL ULTRASONICS SYMPOSIUM (IUS), 2012, : 1039 - 1042
- [30] New trend in THz detection:: High Tc superconducting hot electron bolometer technology may exhibit advantage vs low Tc devices 2007 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-6, 2007, : 345 - +