COMPUTATION OF YIELD AND DRIFT RELIABILITY OF ELECTRONIC CIRCUITS

被引：0
|
作者：
JENSEN, F
机构：
来源：
MICROELECTRONICS AND RELIABILITY | 1972年 / 11卷 / 02期
关键词：
D O I：
10.1016/0026-2714(72)90695-6
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：139 / &
相关论文
共 50 条
  • [21] A study of hot-carrier-induced mismatch drift: A reliability issue for VLSI circuits
    Huh, YJ
    Sung, YK
    Kang, SM
    IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1998, 33 (06) : 921 - 927
  • [22] Study of hot-carrier-induced mismatch drift: a reliability issue for VLSI circuits
    Univ of Illinois at Urbana-Champaign, Urbana, United States
    IEEE J Solid State Circuits, 6 (921-927):
  • [23] Optimal inflation technique in gradient estimation of parametric yield of electronic circuits
    Keramat, M
    42ND MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, PROCEEDINGS, VOLS 1 AND 2, 1999, : 333 - 336
  • [24] YIELD MAXIMIZATION FOR USE IN MULTIPLE CRITERION OPTIMIZATION OF ELECTRONIC CIRCUITS.
    Lightner, M.R.
    Director, S.W.
    1600, IEEE, New York, NY
  • [25] A method of multi-objective reliability tolerance design for electronic circuits
    Zhai Guofu
    Zhou Yuege
    Ye Xuerong
    Hu Bo
    CHINESE JOURNAL OF AERONAUTICS, 2013, 26 (01) : 161 - 170
  • [26] IRAS, AN INTERACTIVE RELIABILITY-ANALYSIS SYSTEM FOR ELECTRONIC-CIRCUITS
    BROMBACHER, AC
    PEETERS, IWFJ
    IEEE TRANSACTIONS ON RELIABILITY, 1985, 34 (05) : 507 - 509
  • [27] Research on the Electronic Circuits Reliability Tolerance Analysis Method and Its Application
    Fan, Yonghong
    Li, Na
    Zhang, Jianguo
    Proceedings of the 2016 6th International Conference on Applied Science, Engineering and Technology (ICASET), 2016, 77 : 60 - 63
  • [28] A method of multi-objective reliability tolerance design for electronic circuits
    Zhai Guofu
    Zhou Yuege
    Ye Xuerong
    Hu Bo
    Chinese Journal of Aeronautics , 2013, (01) : 161 - 170
  • [29] A method of multi-objective reliability tolerance design for electronic circuits
    Zhai Guofu
    Zhou Yuege
    Ye Xuerong
    Hu Bo
    Chinese Journal of Aeronautics, 2013, 26 (01) : 161 - 170
  • [30] Selection of power electronic elements and circuits taking into account reliability and costs
    Borowski, R
    Plachtyna, O
    MODERN PROBLEMS OF RADIO ENGINEERING, TELECOMMUNICATIONS AND COMPUTER SCIENCE, PROCEEDINGS, 2002, : 118 - 121
12345