COMPUTATION OF YIELD AND DRIFT RELIABILITY OF ELECTRONIC CIRCUITS

被引：0
|
作者：
JENSEN, F
机构：
来源：
MICROELECTRONICS AND RELIABILITY | 1972年 / 11卷 / 02期
关键词：
D O I：
10.1016/0026-2714(72)90695-6
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：139 / &
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