QUANTITATIVE ELECTRON-PROBE MICROANALYSIS OF NOBLE-GASES IN SPUTTERED LAYERS OF SEMICONDUCTORS

被引：3
|
作者：
KUCHLER, L
HUNGER, HJ
机构：
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1979年 / 54卷 / 02期
关键词：
D O I：
10.1002/pssa.2210540258
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：K141 / K144
页数：4
相关论文
共 50 条
  • [41] ELECTRON-PROBE MICROANALYSIS OF NICALON FIBERS
    BLEAY, SM
    CHAPMAN, AR
    LOVE, G
    SCOTT, VD
    [J]. JOURNAL OF MATERIALS SCIENCE, 1992, 27 (19) : 5389 - 5396
  • [42] QUANTITATIVE ELECTRON-PROBE MICROANALYSIS OF ULTRALIGHT ELEMENTS (BORON-OXYGEN)
    BASTIN, GF
    HEIJLIGERS, HJM
    [J]. SCANNING, 1990, 12 (04) : 225 - 236
  • [43] METALLURGICAL APPLICATIONS OF ELECTRON-PROBE MICROANALYSIS
    SWINDELLS, N
    [J]. JOURNAL OF THE INSTITUTE OF METALS, 1967, 95 : 316 - +
  • [44] MEASUREMENT OF MICROSEGREGATION BY ELECTRON-PROBE MICROANALYSIS
    FEEST, EA
    [J]. JOURNAL OF THE INSTITUTE OF METALS, 1973, 101 (MAY): : 146 - 149
  • [45] ELECTRON-PROBE MICROANALYSIS - CAPSULE SURVEY
    YAKOWITZ, H
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (06): : 1100 - 1104
  • [46] ELECTRON-PROBE MICROANALYSIS WITH TILTED SPECIMEN
    LANDRON, C
    [J]. JOURNAL OF ENGINEERING AND APPLIED SCIENCES, 1983, 2 (02): : 93 - 102
  • [47] QUANTITATIVE ELECTRON-PROBE MICROANALYSIS OF OXYGEN IN TITANOMAGNETITES WITH IMPLICATIONS FOR OXIDATION PROCESSES
    FURUTA, T
    OTSUKI, M
    AKIMOTO, T
    [J]. JOURNAL OF GEOPHYSICAL RESEARCH-SOLID EARTH AND PLANETS, 1985, 90 (NB4): : 3145 - 3150
  • [48] ELECTRON-PROBE MICROANALYSIS IN STUDY OF GALLSTONES
    BEEN, JM
    BILLS, PM
    LEWIS, D
    [J]. GUT, 1977, 18 (10) : 836 - 842
  • [49] SOME CONSIDERATIONS ON ELECTRON-PROBE MICROANALYSIS
    LEGRAND, C
    [J]. BULLETIN DE LA SOCIETE FRANCAISE DE CERAMIQUE, 1967, (75): : 81 - &
  • [50] ELECTRON-PROBE MICROANALYSIS WITH AGAROSE COVER
    GIMELFARB, FA
    KLYOTSKINA, EV
    FILIPPOV, MN
    ALIMOVA, AN
    SUSLOV, GS
    [J]. IZVESTIYA AKADEMII NAUK SERIYA FIZICHESKAYA, 1995, 59 (02): : 64 - 69
12345