THERMAL ANNEALING OF EXCIMER-LASER-INDUCED DEFECTS IN VIRGIN SILICON

被引:6
|
作者
HARTITI, B
SLAOUI, A
MULLER, JC
SIFFERT, P
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D O I
10.1016/0921-5107(89)90252-3
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T [工业技术];
学科分类号
08 ;
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页码:257 / 260
页数:4
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