DIFFUSE REFLECTANCE MEASUREMENTS USING FOURIER-TRANSFORM INFRARED (FTIR) SPECTROSCOPY

被引：0

|

作者：

WITEK, H

KRISHNAN, K

HILL, SL

MATSUMOTO, H

机构：

[1] DIGILAB,CAMBRIDGE,MA 02139

[2] JASCO INT,TOKYO,JAPAN

来源：

PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS | 1981年 / 289卷

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D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

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页码：108 / 110

页数：3

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