DEMONSTRATION OF CHARGE STORAGE IN DIODES AND MEASUREMENT OF MINORITY CARRIER RECOMBINATION LIFETIME

被引：1
|
作者：
HAMPSHIRE, MJ
机构：
来源：
INTERNATIONAL JOURNAL OF ELECTRICAL ENGINEERING EDUCATION | 1971年 / 9卷 / 02期
关键词：
D O I：
10.1177/002072097100900206
中图分类号：
G40 [教育学];
学科分类号：
040101 ; 120403 ;
摘要：
引用
收藏
页码：110 / +
页数：1
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