DEMONSTRATION OF CHARGE STORAGE IN DIODES AND MEASUREMENT OF MINORITY CARRIER RECOMBINATION LIFETIME

被引：1

|

作者：

HAMPSHIRE, MJ

机构：

来源：

INTERNATIONAL JOURNAL OF ELECTRICAL ENGINEERING EDUCATION | 1971年 / 9卷 / 02期

关键词：

D O I：

10.1177/002072097100900206

中图分类号：

G40 [教育学];

学科分类号：

040101 ; 120403 ;

摘要：

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页码：110 / +

页数：1

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