PREDICTION OF THE RELIABILITY OF OPERATIONAL-AMPLIFIERS ACCORDING TO THE LOW-FREQUENCY NOISE-LEVEL

被引：0
|
作者：
ABRAMOV, EE
VORONTSOV, VN
机构：
来源：
RUSSIAN JOURNAL OF NONDESTRUCTIVE TESTING | 1995年 / 31卷 / 03期
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中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
For the quality control and prediction of the reliability of operational amplifiers used in devices for nondestructive testing it is suggested to use the level and the time dependence of the spectral density of low-frequency noise type 1/f.
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页码：217 / 219
页数：3
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