INCOHERENT EFFECTS DUE TO BEAM CONVERGENCE IN HIGH-RESOLUTION ELECTRON-MICROSCOPY

被引：0

|

作者：

MOREAU, P ^{[1
]}

COENE, W ^{[1
]}

VANDYCK, D ^{[1
]}

VANLANDUYT, J ^{[1
]}

机构：

[1] UNIV ANTWERP,B-2020 ANTWERP,BELGIUM

来源：

MICRON AND MICROSCOPICA ACTA | 1987年 / 18卷 / 03期

关键词：

D O I：

10.1016/0739-6260(87)90077-3

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

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页码：237 / 238

页数：2

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