HIGH-RESOLUTION ELECTRON-MICROSCOPY BY AN INCOHERENT ILLUMINATION METHOD

被引：11

|

作者：

NAGATA, F ^{[1
]}

MATSUDA, T ^{[1
]}

KOMODA, T ^{[1
]}

机构：

[1] HITACHI LTD,CENT RES LAB,KOKUBUNJI,TOKYO,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1975年 / 14卷 / 11期

关键词：

D O I：

10.1143/JJAP.14.1815

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：1815 / 1816

页数：2

相关论文

共 50 条

[1] INCOHERENT EFFECTS DUE TO BEAM CONVERGENCE IN HIGH-RESOLUTION ELECTRON-MICROSCOPY
MOREAU, P
COENE, W
VANDYCK, D
VANLANDUYT, J
[J]. MICRON AND MICROSCOPICA ACTA, 1987, 18 (03): : 237 - 238
[2] RESOLUTION IN HIGH-RESOLUTION ELECTRON-MICROSCOPY
OKEEFE, MA
[J]. ULTRAMICROSCOPY, 1992, 47 (1-3) : 282 - 297
[3] HIGH-RESOLUTION ELECTRON-MICROSCOPY
COWLEY, JM
[J]. ANNUAL REVIEW OF PHYSICAL CHEMISTRY, 1987, 38 : 57 - 88
[4] HIGH-RESOLUTION ELECTRON-MICROSCOPY
HASHIMOTO, H
[J]. ULTRAMICROSCOPY, 1984, 12 (1-2) : 90 - 90
[5] HIGH-RESOLUTION ELECTRON-MICROSCOPY
SMITH, DJ
[J]. HELVETICA PHYSICA ACTA, 1983, 56 (1-3): : 463 - 477
[6] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF DUMORTIERITE
VANDYCK, D
TAMBUYSER, P
VANLANDUYT, J
AMELINCKX, S
[J]. AMERICAN MINERALOGIST, 1976, 61 (9-10) : 1016 - 1019
[7] HIGH-RESOLUTION ANALYTICAL ELECTRON-MICROSCOPY
CARPENTER, RW
[J]. ULTRAMICROSCOPY, 1982, 8 (1-2) : 79 - 93
[8] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF A ZEOLITE
NILSSON, AE
THOMASSON, R
[J]. ULTRAMICROSCOPY, 1988, 24 (01) : 73 - 73
[9] THE FUTURE OF HIGH-RESOLUTION ELECTRON-MICROSCOPY
COWLEY, JM
[J]. ULTRAMICROSCOPY, 1985, 18 (1-4) : 463 - 468
[10] HIGH-RESOLUTION ANALYTICAL ELECTRON-MICROSCOPY
CARPENTER, RW
[J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1981, 182 (AUG): : 102 - INOR

← 1 2 3 4 5 →