DETERMINATION OF TRACE IMPURITIES IN HIGH-PURITY SELENIUM

被引：13

|

作者：

WILLIAMS, AI

机构：

来源：

ANALYST | 1961年 / 86卷 / 102期

关键词：

D O I：

10.1039/an9618600172

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

收藏

页码：172 / &

相关论文

共 50 条

[21] CHEMICOSPECTROGRAPHIC DETERMINATION OF IMPURITIES IN HIGH-PURITY SILVER
ZOLOTOV, YA
VANIFATOVA, NG
CHANYSHEVA, TA
YUDELEVICH, IG
[J]. JOURNAL OF ANALYTICAL CHEMISTRY OF THE USSR, 1977, 32 (02): : 249 - 252
[22] POLAROGRAPHIC DETERMINATION OF IMPURITIES IN HIGH-PURITY PHOSPHORUS
MIWA, T
KONO, T
ISOMURA, R
MIZUIKE, A
[J]. TALANTA, 1970, 17 (01) : 108 - &
[23] DETERMINATION OF MICROAMOUNTS OF SELENIUM IN HIGH-PURITY SULFUR
TUDINO, MB
TROCOOLI, OE
DEALBINATI, JFP
[J]. ANALES DE LA ASOCIACION QUIMICA ARGENTINA, 1984, 72 (06): : 563 - 567
[24] DETERMINATION OF TRACE IMPURITIES IN HIGH-PURITY ALUMINUM-OXIDE BY SPARK SOURCE MS
SASAKI, M
UMADA, Y
WATANABE, H
UMEZAKI, H
[J]. BUNSEKI KAGAKU, 1986, 35 (08) : 753 - 758
[25] Trace metal impurities determination in high-purity polyimide by plasma-based techniques
Santos, Rafael F.
Cruz, Sandra M.
Krzyzaniak, Sindy R.
Duarte, Fabio A.
Mello, Paola A.
Flores, Erico M. M.
[J]. MICROCHEMICAL JOURNAL, 2019, 146 : 492 - 497
[26] DETERMINATION OF TRACE IMPURITIES IN HIGH-PURITY OXYGEN BY GAS-CHROMATOGRAPHY WITH PHOTOIONIZATION DETECTION
OGINO, H
AOMURA, Y
KOMURO, M
KOBAYASHI, T
[J]. ANALYTICAL CHEMISTRY, 1989, 61 (20) : 2237 - 2240
[27] Analysis of high-purity selenium with concentration of impurities by matrix distillation
Chanysheva, TA
Podolyanchenko, SN
Shelpakova, IR
[J]. JOURNAL OF ANALYTICAL CHEMISTRY, 1997, 52 (04) : 368 - 372
[28] DETERMINATION OF TRACE COBALT IN HIGH-PURITY NICKEL
FLASCHKA, H
SPEIGHTS, RM
[J]. MICROCHEMICAL JOURNAL, 1969, 14 (03) : 490 - &
[29] SPECTROCHEMICAL DETERMIANTION OF TRACE-IMPURITIES IN HIGH-PURITY SILICON
VECSERNYES, L
[J]. ZEITSCHRIFT FUR ANALYTISCHE CHEMIE FRESENIUS, 1968, 239 (05): : 294 - +
[30] EVALUATION OF TRACE IMPURITIES IN PREPARATION OF HIGH-PURITY SILICON CARBIDE
BARRETT, DL
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1966, 113 (11) : 1215 - &

← 1 2 3 4 5 →