X-RAY AND OPTICAL PROFILER ANALYSIS OF ELECTROFORMED X-RAY OPTICS

被引：5
|
作者：
MATSUI, Y [1 ]
ULMER, MP [1 ]
TAKACS, PZ [1 ]
机构：
[1] BROOKHAVEN NATL LAB, DIV INSTRUMENTAT, UPTON, NY 11973 USA
来源：
APPLIED OPTICS | 1988年 / 27卷 / 08期
关键词：
D O I：
10.1364/AO.27.001558
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：1558 / 1563
页数：6
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