EMITTER JUNCTION TEMPERATURE-MEASUREMENT UNDER NONUNIFORM CURRENT AND TEMPERATURE DISTRIBUTION

被引：2
|
作者：
ALWIN, VC [1 ]
NAVON, DH [1 ]
机构：
[1] UNIV MASSACHUSETTS,DEPT ELECT & COMP ENGN,AMHERST,MA 01002
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 1976年 / 23卷 / 01期
关键词：
D O I：
10.1109/T-ED.1976.18351
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：64 / 66
页数：3
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