CHARACTERIZATION OF SPRAYED ANTIMONY DOPED TIN OXIDE-FILMS

被引：3

|

作者：

REDDY, PS

UTHANNA, S

REDDY, PJ

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1987年 / 5卷 / 04期

关键词：

D O I：

10.1116/1.574551

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

收藏

页码：1688 / 1690

页数：3

相关论文

共 50 条

[1] CHARACTERIZATION OF ANTIMONY-DOPED TIN OXIDE-FILMS PREPARED BY SPRAY PYROLYSIS
UNAOGU, AL
OKEKE, CE
[J]. SOLAR ENERGY MATERIALS, 1990, 20 (1-2): : 29 - 36
[2] GROWTH AND CHARACTERIZATION OF POLYCRYSTALLINE ANTIMONY-DOPED AND FLUORINE-DOPED TIN OXIDE-FILMS
BELANGER, D
BARTKOWSKI, M
DICKSON, I
DODELET, JP
LOMBOS, BA
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1984, 131 (03) : C90 - C90
[3] SURFACE CHARACTERISTICS OF ANTIMONY-DOPED TIN OXIDE-FILMS
HOFLUND, GB
COX, DF
WOODSON, GL
LAITINEN, HA
[J]. THIN SOLID FILMS, 1981, 78 (04) : 357 - 363
[4] CHARACTERIZATION OF ANTIMONY-DOPED TIN OXIDE-FILMS FOR SOLAR-CELL APPLICATIONS
MURTY, NS
JAWALEKAR, SR
[J]. THIN SOLID FILMS, 1983, 108 (03) : 277 - 283
[5] DOPANT EFFECTS IN SPRAYED TIN OXIDE-FILMS
SHANTHI, E
BANERJEE, A
CHOPRA, KL
[J]. THIN SOLID FILMS, 1982, 88 (02) : 93 - 100
[6] STUDY OF UPWARD AND DOWNWARD SPRAYED FLUORINE-DOPED TIN OXIDE-FILMS
ARYA, SPS
[J]. CRYSTAL RESEARCH AND TECHNOLOGY, 1986, 21 (03) : K38 - K42
[7] ANTIMONY-DOPED TIN OXIDE-FILMS DEPOSITED BY THE OXIDATION OF TETRAMETHYLTIN AND TRIMETHYLANTIMONY
CHOW, TP
GHEZZO, M
BALIGA, BJ
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (05) : 1040 - 1045
[8] PREPARATION AND SURFACE CHARACTERISTICS OF PLATINIZED ANTIMONY-DOPED TIN OXIDE-FILMS
HOFLUND, GB
COX, DF
LAITINEN, HA
[J]. THIN SOLID FILMS, 1981, 83 (02) : 261 - 265
[9] Analysis of critical doping level of sprayed antimony doped tin oxide films
Ravichandran, K.
Philominathan, P.
[J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2011, 22 (02) : 158 - 161
[10] Analysis of critical doping level of sprayed antimony doped tin oxide films
K. Ravichandran
P. Philominathan
[J]. Journal of Materials Science: Materials in Electronics, 2011, 22 : 158 - 161

← 1 2 3 4 5 →