EFFECT OF LAMINAR INHOMOGENEITY ON RESULTS OF MEASURING RESISTIVITY AND HALL EFFECT IN SEMICONDUCTORS

被引：0

作者：

VORONKOV, VV

LEVINZON, DI

IGLITSYN, MI

机构：

来源：

INDUSTRIAL LABORATORY | 1968年 / 34卷 / 03期

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D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：367 / &

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