IEEE DESIGN FOR TESTABILITY WORKSHOP

被引：0

作者：

WILLIAMS, TW

机构：

来源：

IEEE DESIGN & TEST OF COMPUTERS | 1985年 / 2卷 / 04期

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：90 / 91

页数：2

共 50 条

[21] DESIGN FOR TESTABILITY I
JOZWIAK, L
[J]. MICROPROCESSING AND MICROPROGRAMMING, 1992, 35 (1-5): : 375 - 376
[22] Testability Design and Testability Rating for Better Built In Test
DiCesare, James
[J]. 2023 ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM, RAMS, 2023,
[23] VLSI DESIGN FOR TESTABILITY
HUYSKENS, E
VANWAUWE, G
FONDEN, W
SCHULZ, R
[J]. ELECTRICAL COMMUNICATION, 1991, 65 (02): : 175 - 182
[24] DESIGN FOR TESTABILITY.
DeSena, Art
[J]. Electronic Systems Technology and Design/Computer Design's, 1988, 27 (07): : 90 - 91
[25] IEEE WORKSHOP ON SUBMICROMETER LITHOGRAPHY
POWELL, MW
[J]. SOLID STATE TECHNOLOGY, 1991, 34 (12) : 54 - 55
[26] IEEE PATTERN RECOGNITION WORKSHOP
FERN, L
[J]. DATAMATION, 1967, 13 (02): : 84 - &
[27] A DESIGN FOR MANUFACTURABILITY, DESIGN FOR TESTABILITY CHECKLIST
不详
[J]. HEWLETT-PACKARD JOURNAL, 1993, 44 (02): : 33 - 33
[28] 2005 IEEE International Workshop on VLSI Design and Video Technology(IWVDVT 2005)
[J]. 数据采集与处理, 2005, (01) : 27 - 27
[29] DESIGN FOR TESTABILITY USING INCOMPLETE SCAN PATH AND TESTABILITY ANALYSIS
TRISCHLER, E
[J]. SIEMENS FORSCHUNGS-UND ENTWICKLUNGSBERICHTE-SIEMENS RESEARCH AND DEVELOPMENT REPORTS, 1984, 13 (02): : 56 - 61
[30] Communications software design for testability: specification transformations and testability measures
Dssouli, R
Karoui, K
Saleh, K
Cherkaoui, O
[J]. INFORMATION AND SOFTWARE TECHNOLOGY, 1999, 41 (11-12) : 729 - 743