共 50 条
- [41] SCANNING-TRANSMISSION ELECTRON-MICROSCOPY [J]. JOURNAL DE PHYSIQUE IV, 1993, 3 (C7): : 2073 - 2080
- [42] TRANSMISSION ELECTRON-MICROSCOPY OF MODULATED STRUCTURES [J]. SCRIPTA METALLURGICA, 1986, 20 (04): : 451 - 456
- [43] RESOLUTION IN CONVENTIONAL TRANSMISSION ELECTRON-MICROSCOPY [J]. ULTRAMICROSCOPY, 1992, 47 (1-3) : 145 - 161
- [44] REPLICA TECHNIQUES FOR TRANSMISSION ELECTRON-MICROSCOPY [J]. REPORT OF NRL PROGRESS, 1976, (APR): : 7 - 8
- [45] TRANSMISSION ELECTRON-MICROSCOPY IN MATERIALS SCIENCES [J]. JOURNAL OF METALS, 1988, 40 (07): : A24 - A24
- [46] DETECTOR SYSTEMS FOR TRANSMISSION ELECTRON-MICROSCOPY [J]. JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1984, 9 (04): : 329 - &
- [47] PREPARATION OF FUNGI FOR TRANSMISSION ELECTRON-MICROSCOPY [J]. MICRON, 1980, 11 (3-4) : 495 - 496
- [49] A TRANSMISSION ELECTRON-MICROSCOPY STUDY OF CRISTOBALITE [J]. PHASE TRANSITIONS, 1989, 16 : 41 - 45
- [50] ORIENTATIONAL MATRICES IN TRANSMISSION ELECTRON-MICROSCOPY [J]. INDUSTRIAL LABORATORY, 1979, 45 (12): : 1370 - 1380