HOLOGRAPHY APPLIED TO INSPECTION AND MENSURATION IN AN INDUSTRIAL-ENVIRONMENT

被引：0

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作者：

TOZER, BA

GLANVILLE, R

GORDON, AL

LITTLE, MJ

WEBSTER, JM

WRIGHT, DG

机构：

来源：

PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS | 1985年 / 523卷

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O43 [光学];

学科分类号：

070207 ; 0803 ;

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页码：119 / 130

页数：12

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